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Energy Storage Characteristics of BiFeO(3)/BaTiO(3) Bi-Layers Integrated on Si
BiFeO(3)/BaTiO(3) bi-layer thick films (~1 μm) were deposited on Pt/Ti/SiO(2)/(100) Si substrates with LaNiO(3) buffer layers at 500 °C via a rf magnetron sputtering process. X-ray diffraction (XRD) analysis revealed that both BiFeO(3) and BaTiO(3) layers have a (00l) preferred orientation. The film...
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| Pubblicato in: | Materials (Basel) |
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| Autori principali: | , , , , |
| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
MDPI
2016
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| Soggetti: | |
| Accesso online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5457274/ https://ncbi.nlm.nih.gov/pubmed/28774055 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma9110935 |
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