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The Effect of Cu:Ag Atomic Ratio on the Properties of Sputtered Cu–Ag Alloy Thin Films
Cu–Ag thin films with various atomic ratios were prepared using a co-sputtering technique, followed by rapid thermal annealing at various temperatures. The films’ structural, mechanical, and electrical properties were then characterized using X-ray diffractometry (XRD), atomic force microscopy (AFM)...
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| Izdano u: | Materials (Basel) |
|---|---|
| Glavni autori: | , |
| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
MDPI
2016
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| Teme: | |
| Online pristup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5457197/ https://ncbi.nlm.nih.gov/pubmed/28774033 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma9110914 |
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