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Spectral dependence of carrier lifetimes in silicon for photovoltaic applications
Charge carrier lifetimes in photovoltaic-grade silicon wafers were measured by a spectral-dependent, quasi-steady-state photoconductance technique. Narrow bandwidth light emitting diodes (LEDs) were used to excite excess charge carriers within the material, and the effective lifetimes of these carri...
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| Pubblicato in: | J Appl Phys |
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| Autori principali: | , , , |
| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
2016
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| Soggetti: | |
| Accesso online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5455797/ https://ncbi.nlm.nih.gov/pubmed/28584383 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.4972409 |
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