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Raman Microscopic Analysis of Internal Stress in Boron-Doped Diamond
Analysis of the induced stress on undoped and boron-doped diamond (BDD) thin films by confocal Raman microscopy is performed in this study to investigate its correlation with sample chemical composition and the substrate used during fabrication. Knowledge of this nature is very important to the issu...
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| Veröffentlicht in: | Materials (Basel) |
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| Hauptverfasser: | , , , , , , , , |
| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
MDPI
2015
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| Schlagworte: | |
| Online Zugang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5455545/ https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma8052782 |
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