Raman Microscopic Analysis of Internal Stress in Boron-Doped Diamond

Analysis of the induced stress on undoped and boron-doped diamond (BDD) thin films by confocal Raman microscopy is performed in this study to investigate its correlation with sample chemical composition and the substrate used during fabrication. Knowledge of this nature is very important to the issu...

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Библиографические подробности
Опубликовано в: :Materials (Basel)
Главные авторы: Bennet, Kevin E., Lee, Kendall H., Tomshine, Jonathan R., Sundin, Emma M., Kruchowski, James N., Durrer, William G., Manciu, Bianca M., Kouzani, Abbas, Manciu, Felicia S.
Формат: Artigo
Язык:Inglês
Опубликовано: MDPI 2015
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Article
Online-ссылка:https://ncbi.nlm.nih.gov/pmc/articles/PMC5455545/
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma8052782
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