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STM, SECPM, AFM and Electrochemistry on Single Crystalline Surfaces
Scanning probe microscopy (SPM) techniques have had a great impact on research fields of surface science and nanotechnology during the last decades. They are used to investigate surfaces with scanning ranges between several 100 μm down to atomic resolution. Depending on experimental conditions, and...
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| Veröffentlicht in: | Materials (Basel) |
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| Hauptverfasser: | , , , , , |
| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
MDPI
2010
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| Schlagworte: | |
| Online Zugang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5445822/ https://ncbi.nlm.nih.gov/pubmed/28883327 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma3084196 |
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