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STM, SECPM, AFM and Electrochemistry on Single Crystalline Surfaces
Scanning probe microscopy (SPM) techniques have had a great impact on research fields of surface science and nanotechnology during the last decades. They are used to investigate surfaces with scanning ranges between several 100 μm down to atomic resolution. Depending on experimental conditions, and...
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| Publicado no: | Materials (Basel) |
|---|---|
| Main Authors: | , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI
2010
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5445822/ https://ncbi.nlm.nih.gov/pubmed/28883327 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma3084196 |
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