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A fast image simulation algorithm for scanning transmission electron microscopy
Image simulation for scanning transmission electron microscopy at atomic resolution for samples with realistic dimensions can require very large computation times using existing simulation algorithms. We present a new algorithm named PRISM that combines features of the two most commonly used algorit...
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| Gepubliceerd in: | Adv Struct Chem Imaging |
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| Hoofdauteur: | |
| Formaat: | Artigo |
| Taal: | Inglês |
| Gepubliceerd in: |
Springer International Publishing
2017
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| Onderwerpen: | |
| Online toegang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5423922/ https://ncbi.nlm.nih.gov/pubmed/28546904 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s40679-017-0046-1 |
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