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Functional dependence of resonant harmonics on nanomechanical parameters in dynamic mode atomic force microscopy
We present a combined theoretical and experimental study of the dependence of resonant higher harmonics of rectangular cantilevers of an atomic force microscope (AFM) as a function of relevant parameters such as the cantilever force constant, tip radius and free oscillation amplitude as well as the...
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| Publicat a: | Beilstein J Nanotechnol |
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| Autors principals: | , , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Beilstein-Institut
2017
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5405692/ https://ncbi.nlm.nih.gov/pubmed/28503399 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.8.90 |
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