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Self-assembly of silicon nanowires studied by advanced transmission electron microscopy
Scanning transmission electron microscopy (STEM) was successfully applied to the analysis of silicon nanowires (SiNWs) that were self-assembled during an inductively coupled plasma (ICP) process. The ICP-synthesized SiNWs were found to present a Si–SiO(2) core–shell structure and length varying from...
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| Publicado no: | Beilstein J Nanotechnol |
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| Main Authors: | , , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Beilstein-Institut
2017
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5331248/ https://ncbi.nlm.nih.gov/pubmed/28326234 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.8.47 |
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