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Multimodal cantilevers with novel piezoelectric layer topology for sensitivity enhancement
Self-sensing techniques for atomic force microscope (AFM) cantilevers have several advantageous characteristics compared to the optical beam deflection method. The possibility of down scaling, parallelization of cantilever arrays and the absence of optical interference associated imaging artifacts h...
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| Publicado no: | Beilstein J Nanotechnol |
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| Main Authors: | , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Beilstein-Institut
2017
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5331182/ https://ncbi.nlm.nih.gov/pubmed/28326225 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.8.38 |
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