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Structured illumination microscopy with unknown patterns and a statistical prior
Structured illumination microscopy (SIM) improves resolution by down-modulating high-frequency information of an object to fit within the passband of the optical system. Generally, the reconstruction process requires prior knowledge of the illumination patterns, which implies a well-calibrated and a...
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| Publicado no: | Biomed Opt Express |
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| Main Authors: | , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Optical Society of America
2017
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5330558/ https://ncbi.nlm.nih.gov/pubmed/28270977 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1364/BOE.8.000695 |
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