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Temperature spectra of conductance of Ge/Si p-i-n structures with Ge quantum dots
This work presents results of investigation of Ge/Si p-i-n structures with Ge quantum dots in the i-region by the method of admittance spectroscopy. The structures contain multiple layers with Ge quantum dots separated by thin 5 nm layers of Si in the intrinsic region. Two peaks are observed on the...
Tallennettuna:
| Julkaisussa: | Nanoscale Res Lett |
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| Päätekijät: | , , , , , , |
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
Springer US
2017
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5318315/ https://ncbi.nlm.nih.gov/pubmed/28235368 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s11671-017-1916-0 |
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