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Dynamic crystal rotation resolved by high-speed synchrotron X-ray Laue diffraction

Dynamic compression experiments are performed on single-crystal Si under split Hopkinson pressure bar loading, together with simultaneous high-speed (250–350 ns resolution) synchrotron X-ray Laue diffraction and phase-contrast imaging. A methodology is presented which determines crystal rotation par...

Täydet tiedot

Tallennettuna:
Bibliografiset tiedot
Julkaisussa:J Synchrotron Radiat
Päätekijät: Huang, J. W., E, J. C., Huang, J. Y., Sun, T., Fezzaa, K., Luo, S. N.
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: International Union of Crystallography 2016
Aiheet:
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC5315007/
https://ncbi.nlm.nih.gov/pubmed/27140150
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S160057751600223X
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