Načítá se...
Electrostatic-free piezoresponse force microscopy
Contact and non-contact based atomic force microscopy (AFM) approaches have been extensively utilized to explore various nanoscale surface properties. In most AFM-based measurements, a concurrent electrostatic effect between the AFM tip/cantilever and sample surface can occur. This electrostatic eff...
Uloženo v:
| Vydáno v: | Sci Rep |
|---|---|
| Hlavní autoři: | , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Nature Publishing Group
2017
|
| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5282565/ https://ncbi.nlm.nih.gov/pubmed/28139715 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep41657 |
| Tagy: |
Přidat tag
Žádné tagy, Buďte první, kdo otaguje tento záznam!
|