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Endurance and Cycle-to-cycle Uniformity Improvement in Tri-Layered CeO(2)/Ti/CeO(2) Resistive Switching Devices by Changing Top Electrode Material
Resistance switching characteristics of CeO(2)/Ti/CeO(2) tri-layered films sandwiched between Pt bottom electrode and two different top electrodes (Ti and TaN) with different work functions have been investigated. RRAM memory cells composed of TaN/CeO(2)/Ti/CeO(2)/Pt reveal better resistive switchin...
Shranjeno v:
| izdano v: | Sci Rep |
|---|---|
| Main Authors: | , , , , , , , , , |
| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
Nature Publishing Group
2017
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| Teme: | |
| Online dostop: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5227716/ https://ncbi.nlm.nih.gov/pubmed/28079056 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep39539 |
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