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Analysis at the Atomic Level: The Atom Probe Field-Ion Microscope
Shranjeno v:
| izdano v: | J Res Natl Bur Stand (1977) |
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| Glavni avtor: | |
| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1988
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| Teme: | |
| Online dostop: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5181926/ https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.093.083 |
| Oznake: |
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