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Temperature and microwave near field imaging by thermo-elastic optical indicator microscopy
A high resolution imaging of the temperature and microwave near field can be a powerful tool for the non-destructive testing of materials and devices. However, it is presently a very challenging issue due to the lack of a practical measurement pathway. In this work, we propose and demonstrate experi...
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| Publicado no: | Sci Rep |
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| Main Authors: | , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group
2016
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5177872/ https://ncbi.nlm.nih.gov/pubmed/28004783 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep39696 |
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