High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy

A new method for high-resolution quantitative measurement of the dielectric function by using scattering scanning near-field optical microscopy (s-SNOM) is presented. The method is based on a calibration procedure that uses the s-SNOM oscillating dipole model of the probe-sample interaction and quan...

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Bibliografiset tiedot
Julkaisussa:Sci Rep
Päätekijät: Tranca, D. E., Stanciu, S. G., Hristu, R., Stoichita, C., Tofail, S. A. M., Stanciu, G. A.
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Nature Publishing Group 2015
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Article
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC5155613/
https://ncbi.nlm.nih.gov/pubmed/26138665
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep11876
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