High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy

A new method for high-resolution quantitative measurement of the dielectric function by using scattering scanning near-field optical microscopy (s-SNOM) is presented. The method is based on a calibration procedure that uses the s-SNOM oscillating dipole model of the probe-sample interaction and quan...

全面介紹

Na minha lista:
書目詳細資料
發表在:Sci Rep
Main Authors: Tranca, D. E., Stanciu, S. G., Hristu, R., Stoichita, C., Tofail, S. A. M., Stanciu, G. A.
格式: Artigo
語言:Inglês
出版: Nature Publishing Group 2015
主題:
Article
在線閱讀:https://ncbi.nlm.nih.gov/pmc/articles/PMC5155613/
https://ncbi.nlm.nih.gov/pubmed/26138665
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep11876
標簽: 添加標簽
沒有標簽, 成為第一個標記此記錄!

相似書籍