Tranca, D. E., Stanciu, S. G., Hristu, R., Stoichita, C., Tofail, S. A. M., & Stanciu, G. A. (2015). High-resolution quantitative determination of dielectric function by using scattering scanning near-field optical microscopy. Sci Rep.

Tranca, D. E., S. G. Stanciu, R. Hristu, C. Stoichita, S. A. M. Tofail, und G. A. Stanciu. "High-resolution Quantitative Determination of Dielectric Function By Using Scattering Scanning Near-field Optical Microscopy." Sci Rep 2015.

Tranca, D. E., et al. "High-resolution Quantitative Determination of Dielectric Function By Using Scattering Scanning Near-field Optical Microscopy." Sci Rep 2015.