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Scattering-type scanning near-field optical microscopy with low-repetition-rate pulsed light source through phase-domain sampling
Scattering-type scanning near-field optical microscopy (s-SNOM) allows spectroscopic imaging with spatial resolution below the diffraction limit. With suitable light sources, s-SNOM is instrumental in numerous discoveries at the nanoscale. So far, the light sources have been limited to continuous wa...
Gorde:
| Argitaratua izan da: | Nat Commun |
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| Egile Nagusiak: | , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
Nature Publishing Group
2016
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5071641/ https://ncbi.nlm.nih.gov/pubmed/27748360 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/ncomms13212 |
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