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Fault Diagnosis for Analog Circuits by Using EEMD, Relative Entropy, and ELM
This paper presents a novel fault diagnosis method for analog circuits using ensemble empirical mode decomposition (EEMD), relative entropy, and extreme learning machine (ELM). First, nominal and faulty response waveforms of a circuit are measured, respectively, and then are decomposed into intrinsi...
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| Veröffentlicht in: | Comput Intell Neurosci |
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| Hauptverfasser: | , , |
| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
Hindawi Publishing Corporation
2016
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| Schlagworte: | |
| Online Zugang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5031911/ https://ncbi.nlm.nih.gov/pubmed/27698663 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1155/2016/7657054 |
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