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The demonstration of significant ferroelectricity in epitaxial Y-doped HfO(2) film
Ferroelectricity and Curie temperature are demonstrated for epitaxial Y-doped HfO(2) film grown on (110) yttrium oxide-stabilized zirconium oxide (YSZ) single crystal using Sn-doped In(2)O(3) (ITO) as bottom electrodes. The XRD measurements for epitaxial film enabled us to investigate its detailed c...
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| Publicat a: | Sci Rep |
|---|---|
| Autors principals: | , , , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Nature Publishing Group
2016
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5016896/ https://ncbi.nlm.nih.gov/pubmed/27608815 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep32931 |
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