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Microstructure evolution with varied layer thickness in magnetron-sputtered Ni/C multilayer films

The microstructure evolution of magnetron-sputtered Ni/C multilayers was investigated by varying the Ni and C layer thickness in the region of a few nanometers. For the samples having 2.6-nm-thick C layers, the interface width increases from 0.37 to 0.81 nm as the Ni layer thickness decreases from 4...

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Detalhes bibliográficos
Publicado no:Sci Rep
Main Authors: Peng, Jichang, Li, Wenbin, Huang, Qiushi, Wang, Zhanshan
Formato: Artigo
Idioma:Inglês
Publicado em: Nature Publishing Group 2016
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC4981846/
https://ncbi.nlm.nih.gov/pubmed/27515586
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep31522
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