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Understanding interferometry for micro-cantilever displacement detection
Interferometric displacement detection in a cantilever-based non-contact atomic force microscope (NC-AFM) operated in ultra-high vacuum is demonstrated for the Michelson and Fabry–Pérot modes of operation. Each mode is addressed by appropriately adjusting the distance between the fiber end deliverin...
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| Publicat a: | Beilstein J Nanotechnol |
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| Autors principals: | , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Beilstein-Institut
2016
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4979913/ https://ncbi.nlm.nih.gov/pubmed/27547601 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.7.76 |
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