טוען...
Experimental and simulation-based investigation of He, Ne and Ar irradiation of polymers for ion microscopy
Secondary ion mass spectrometry (SIMS) on the helium ion microscope (HIM) promises higher lateral resolution than on classical SIMS instruments. However, full advantage of this new technique can only be obtained when the interaction of He(+) or Ne(+) primary ions with the sample is fully controlled....
שמור ב:
| הוצא לאור ב: | Beilstein J Nanotechnol |
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| Main Authors: | , , , |
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
Beilstein-Institut
2016
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4979758/ https://ncbi.nlm.nih.gov/pubmed/27547629 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.7.104 |
| תגים: |
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