Stationary beam full-field transmission helium ion microscopy using sub-50 keV He(+): Projected images and intensity patterns

A dedicated transmission helium ion microscope (THIM) for sub-50 keV helium has been constructed to investigate ion scattering processes and contrast mechanisms, aiding the development of new imaging and analysis modalities. Unlike a commercial helium ion microscope (HIM), the in-house built instrum...

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Bibliografiska uppgifter
I publikationen:Beilstein J Nanotechnol
Huvudupphovsmän: Mousley, Michael, Eswara, Santhana, De Castro, Olivier, Bouton, Olivier, Klingner, Nico, Koch, Christoph T, Hlawacek, Gregor, Wirtz, Tom
Materialtyp: Artigo
Språk:Inglês
Publicerad: Beilstein-Institut 2019
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Full Research Paper
Länkar:https://ncbi.nlm.nih.gov/pmc/articles/PMC6693417/
https://ncbi.nlm.nih.gov/pubmed/31467826
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.10.160
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