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Rotation of X-ray polarization in the glitches of a silicon crystal monochromator
EXAFS studies on dilute samples are usually carried out by collecting the fluorescence yield using a large-area multi-element detector. This method is susceptible to the ‘glitches’ produced by all single-crystal monochromators. Glitches are sharp dips or spikes in the diffracted intensity at specifi...
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| Publicat a: | J Appl Crystallogr |
|---|---|
| Autors principals: | , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
International Union of Crystallography
2016
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4970495/ https://ncbi.nlm.nih.gov/pubmed/27504076 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576716009183 |
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