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Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image Sensors
SPAD-based solid state CMOS image sensors utilising analogue integrators have attained deep sub-electron read noise (DSERN) permitting single photon counting (SPC) imaging. A new method is proposed to determine the read noise in DSERN image sensors by evaluating the peak separation and width (PSW) o...
में बचाया:
| में प्रकाशित: | Sensors (Basel) |
|---|---|
| मुख्य लेखकों: | , , , |
| स्वरूप: | Artigo |
| भाषा: | Inglês |
| प्रकाशित: |
MDPI
2016
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| विषय: | |
| ऑनलाइन पहुंच: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4970165/ https://ncbi.nlm.nih.gov/pubmed/27447643 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s16071122 |
| टैग : |
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