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Single Photon Counting Performance and Noise Analysis of CMOS SPAD-Based Image Sensors
SPAD-based solid state CMOS image sensors utilising analogue integrators have attained deep sub-electron read noise (DSERN) permitting single photon counting (SPC) imaging. A new method is proposed to determine the read noise in DSERN image sensors by evaluating the peak separation and width (PSW) o...
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| Vydáno v: | Sensors (Basel) |
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| Hlavní autoři: | , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
MDPI
2016
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4970165/ https://ncbi.nlm.nih.gov/pubmed/27447643 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s16071122 |
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