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High energy X-ray phase and dark-field imaging using a random absorption mask
High energy X-ray imaging has unique advantage over conventional X-ray imaging, since it enables higher penetration into materials with significantly reduced radiation damage. However, the absorption contrast in high energy region is considerably low due to the reduced X-ray absorption cross section...
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| Publicado no: | Sci Rep |
|---|---|
| Main Authors: | , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group
2016
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4964655/ https://ncbi.nlm.nih.gov/pubmed/27466217 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep30581 |
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