Caricamento...
High energy X-ray phase and dark-field imaging using a random absorption mask
High energy X-ray imaging has unique advantage over conventional X-ray imaging, since it enables higher penetration into materials with significantly reduced radiation damage. However, the absorption contrast in high energy region is considerably low due to the reduced X-ray absorption cross section...
Salvato in:
| Pubblicato in: | Sci Rep |
|---|---|
| Autori principali: | , , , |
| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
Nature Publishing Group
2016
|
| Soggetti: | |
| Accesso online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4964655/ https://ncbi.nlm.nih.gov/pubmed/27466217 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep30581 |
| Tags: |
Aggiungi Tag
Nessun Tag, puoi essere il primo ad aggiungerne! !
|