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Robustness to Faults Promotes Evolvability: Insights from Evolving Digital Circuits

We demonstrate how the need to cope with operational faults enables evolving circuits to find more fit solutions. The analysis of the results obtained in different experimental conditions indicates that, in absence of faults, evolution tends to select circuits that are small and have low phenotypic...

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Bibliografische gegevens
Gepubliceerd in:PLoS One
Hoofdauteurs: Milano, Nicola, Nolfi, Stefano
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: Public Library of Science 2016
Onderwerpen:
Online toegang:https://ncbi.nlm.nih.gov/pmc/articles/PMC4943595/
https://ncbi.nlm.nih.gov/pubmed/27409589
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1371/journal.pone.0158627
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