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Robustness to Faults Promotes Evolvability: Insights from Evolving Digital Circuits

We demonstrate how the need to cope with operational faults enables evolving circuits to find more fit solutions. The analysis of the results obtained in different experimental conditions indicates that, in absence of faults, evolution tends to select circuits that are small and have low phenotypic...

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Detalhes bibliográficos
Publicado no:PLoS One
Main Authors: Milano, Nicola, Nolfi, Stefano
Formato: Artigo
Idioma:Inglês
Publicado em: Public Library of Science 2016
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC4943595/
https://ncbi.nlm.nih.gov/pubmed/27409589
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1371/journal.pone.0158627
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