Loading...

Conference Report: SECOND WORKSHOP ON INDUSTRIAL APPLICATIONS OF SCANNED PROBE MICROSCOPY Gaithersburg, MD May 2–3, 1995

Na minha lista:
Bibliografiske detaljer
Udgivet i:J Res Natl Inst Stand Technol
Main Authors: Dagata, John A., Diebold, Alain C., Ken Shih, C. K., Colton, Richard J.
Format: Artigo
Sprog:Inglês
Udgivet: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1996
Fag:
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC4907606/
https://ncbi.nlm.nih.gov/pubmed/27805094
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.101.009
Tags: Tilføj Tag
Ingen Tags, Vær først til at tagge denne postø!