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Conference Report: SECOND WORKSHOP ON INDUSTRIAL APPLICATIONS OF SCANNED PROBE MICROSCOPY Gaithersburg, MD May 2–3, 1995
Guardat en:
| Publicat a: | J Res Natl Inst Stand Technol |
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| Autors principals: | , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1996
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4907606/ https://ncbi.nlm.nih.gov/pubmed/27805094 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.101.009 |
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