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Phase Identification in a Scanning Electron Microscope Using Backscattered Electron Kikuchi Patterns
Backscattered electron Kikuchi patterns (BEKP) suitable for crystallographic phase analysis can be collected in the scanning electron microscope (SEM) with a newly developed charge coupled device (CCD) based detector. Crystallographic phase identification using BEKP in the SEM is unique in that it p...
Tallennettuna:
| Julkaisussa: | J Res Natl Inst Stand Technol |
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| Päätekijät: | , |
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
1996
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4894610/ https://ncbi.nlm.nih.gov/pubmed/27805167 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.101.031 |
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