Phase Identification in a Scanning Electron Microscope Using Backscattered Electron Kikuchi Patterns

Backscattered electron Kikuchi patterns (BEKP) suitable for crystallographic phase analysis can be collected in the scanning electron microscope (SEM) with a newly developed charge coupled device (CCD) based detector. Crystallographic phase identification using BEKP in the SEM is unique in that it p...

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Udgivet i:J Res Natl Inst Stand Technol
Main Authors: Goehner, R. P., Michael, J. R.
Format: Artigo
Sprog:Inglês
Udgivet: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology 1996
Fag:
Article
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC4894610/
https://ncbi.nlm.nih.gov/pubmed/27805167
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.101.031
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