Wird geladen...

Pushing phase and amplitude sensitivity limits in interferometric microscopy

Sensitivity of the amplitude and phase measurements in interferometric microscopy is influenced by factors such as instrument design and environmental interferences. Through development of a theoretical framework followed by experimental validation, we show photon shot noise is often the limiting fa...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Opt Lett
Hauptverfasser: Hosseini, Poorya, Zhou, Renjie, Kim, Yang-Hyo, Peres, Chiara, Diaspro, Alberto, Kuang, Cuifang, Yaqoob, Zahid, So, Peter T. C.
Format: Artigo
Sprache:Inglês
Veröffentlicht: 2016
Schlagworte:
Online Zugang:https://ncbi.nlm.nih.gov/pmc/articles/PMC4874737/
https://ncbi.nlm.nih.gov/pubmed/27192311
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!