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Modeling the depth-sectioning effect in reflection-mode dynamic speckle-field interferometric microscopy
Unlike most optical coherence microscopy (OCM) systems, dynamic speckle-field interferometric microscopy (DSIM) achieves depth sectioning through the spatial-coherence gating effect. Under high numerical aperture (NA) speckle-field illumination, our previous experiments have demonstrated less than 1...
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| Publicado no: | Opt Express |
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| Main Authors: | , , , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Optical Society of America
2017
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5772461/ https://ncbi.nlm.nih.gov/pubmed/28085800 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1364/OE.25.000130 |
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