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Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers
A compact electron source specifically designed for time-resolved diffraction studies of free-standing thin films and monolayers is presented here. The sensitivity to thin samples is achieved by extending the established technique of ultrafast electron diffraction to the “medium” energy regime (1–10...
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| Publié dans: | Struct Dyn |
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| Auteurs principaux: | , , |
| Format: | Artigo |
| Langue: | Inglês |
| Publié: |
American Crystallographic Association
2016
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| Sujets: | |
| Accès en ligne: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4866961/ https://ncbi.nlm.nih.gov/pubmed/27226978 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.4949538 |
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