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Electron Diffraction Using Transmission Electron Microscopy
Electron diffraction via the transmission electron microscope is a powerful method for characterizing the structure of materials, including perfect crystals and defect structures. The advantages of electron diffraction over other methods, e.g., x-ray or neutron, arise from the extremely short wavele...
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| Publicado en: | J Res Natl Inst Stand Technol |
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| Main Authors: | , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
2001
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| Assuntos: | |
| Acceso en liña: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4865294/ https://ncbi.nlm.nih.gov/pubmed/27500060 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.106.051 |
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