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Limitations to Accuracy in Extracting Characteristic Line Intensities From X-Ray Spectra
The early development of quantitative electron probe microanalysis, first using crystal spectrometers, then energy dispersive x-ray spectrometers (EDXS), demonstrated that elements could be detected at 0.001 mass fraction level and major concentrations measured within 2 % relative uncertainty. Howev...
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| Publicado no: | J Res Natl Inst Stand Technol |
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| Autor principal: | |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
2002
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4863855/ https://ncbi.nlm.nih.gov/pubmed/27446751 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.107.045 |
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