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Decomposition of Wavelength Dispersive X-Ray Spectra
Line shapes of atomic lines and soft x-ray emission bands measured with a wavelength dispersive spectrometer (WDS) with the Electron Probe Micro Analyzer (EPMA) are reviewed. Least square fitting to pseudo-Voigt profiles of the digitally measured spectra are used to account for the presence of non-d...
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| Publicado no: | J Res Natl Inst Stand Technol |
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| Main Authors: | , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
2002
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4863852/ https://ncbi.nlm.nih.gov/pubmed/27446750 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.107.044 |
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