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In situ Stiffness Adjustment of AFM Probes by Two Orders of Magnitude

The choice on which type of cantilever to use for Atomic Force Microscopy (AFM) depends on the type of the experiment being done. Typically, the cantilever has to be exchanged when a different stiffness is required and the entire alignment has to be repeated. In the present work, a method to adjust...

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Bibliografische gegevens
Gepubliceerd in:Sensors (Basel)
Hoofdauteurs: de Laat, Marcel Lambertus Cornelis, Pérez Garza, Héctor Hugo, Ghatkesar, Murali Krishna
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: MDPI 2016
Onderwerpen:
Online toegang:https://ncbi.nlm.nih.gov/pmc/articles/PMC4851037/
https://ncbi.nlm.nih.gov/pubmed/27077863
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s16040523
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