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In situ Stiffness Adjustment of AFM Probes by Two Orders of Magnitude

The choice on which type of cantilever to use for Atomic Force Microscopy (AFM) depends on the type of the experiment being done. Typically, the cantilever has to be exchanged when a different stiffness is required and the entire alignment has to be repeated. In the present work, a method to adjust...

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Detalhes bibliográficos
Publicado no:Sensors (Basel)
Main Authors: de Laat, Marcel Lambertus Cornelis, Pérez Garza, Héctor Hugo, Ghatkesar, Murali Krishna
Formato: Artigo
Idioma:Inglês
Publicado em: MDPI 2016
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC4851037/
https://ncbi.nlm.nih.gov/pubmed/27077863
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s16040523
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