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In situ synchrotron study of electromigration induced grain rotations in Sn solder joints
Here we report an in situ study of the early stage of microstructure evolution induced by electromigration in a Pb-free β-Sn based solder joint by synchrotron polychromatic X-ray microdiffraction. With this technique, crystal orientation evolution is monitored at intragranular levels with high spati...
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| 出版年: | Sci Rep |
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| 主要な著者: | , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Nature Publishing Group
2016
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4834559/ https://ncbi.nlm.nih.gov/pubmed/27086863 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep24418 |
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