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Nanoscale characterization of local structures and defects in photonic crystals using synchrotron-based transmission soft X-ray microscopy
For the structural characterization of the polystyrene (PS)-based photonic crystals (PCs), fast and direct imaging capabilities of full field transmission X-ray microscopy (TXM) were demonstrated at soft X-ray energy. PS-based PCs were prepared on an O(2)-plasma treated Si(3)N(4) window and their lo...
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| Publicado no: | Sci Rep |
|---|---|
| Main Authors: | , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group
2016
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4834481/ https://ncbi.nlm.nih.gov/pubmed/27087141 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep24488 |
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