Nanoscale characterization of local structures and defects in photonic crystals using synchrotron-based transmission soft X-ray microscopy

For the structural characterization of the polystyrene (PS)-based photonic crystals (PCs), fast and direct imaging capabilities of full field transmission X-ray microscopy (TXM) were demonstrated at soft X-ray energy. PS-based PCs were prepared on an O(2)-plasma treated Si(3)N(4) window and their lo...

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Bibliographic Details
Published in:Sci Rep
Main Authors: Nho, Hyun Woo, Kalegowda, Yogesh, Shin, Hyun-Joon, Yoon, Tae Hyun
Format: Artigo
Language:Inglês
Published: Nature Publishing Group 2016
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Online Access:https://ncbi.nlm.nih.gov/pmc/articles/PMC4834481/
https://ncbi.nlm.nih.gov/pubmed/27087141
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep24488
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