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In situ spectroscopic study of the plastic deformation of amorphous silicon under non-hydrostatic conditions induced by indentation
Indentation-induced plastic deformation of amorphous silicon (a-Si) thin films was studied by in situ Raman imaging of the deformed contact region of an indented sample, employing a Raman spectroscopy-enhanced instrumented indentation technique. Quantitative analyses of the generated in situ Raman m...
Gorde:
| Argitaratua izan da: | Phys Rev B Condens Matter Mater Phys |
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| Egile Nagusiak: | , , , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
2015
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4764801/ https://ncbi.nlm.nih.gov/pubmed/26924926 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1103/PhysRevB.92.214110 |
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